Multi-product Cycle Time and Throughput Evaluation via Simulation on Demand
نویسندگان
چکیده
In this paper, we will discuss our efforts to create the next generation of semiconductor factory simulation tools, which we call complete response-surface mapping (cRSM). More specifically, we will describe the basic research and software development necessary to produce the capability to provide simulation results on demand for cycle-time measures as a function of throughput and product mix.
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